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IEC 62416-ed.1.0

Semiconductor devices - Hot carrier test on MOS transistors

STANDARD published on 26.4.2010

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The information about the standard:

Designation standards: IEC 62416-ed.1.0
Publication date standards: 26.4.2010
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 62416-ed.1.0 :

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime. La CEI 62416:2010 decrit lessai de porteur chaud au niveau de la plaquette sur les transistors NMOS et PMOS. Cet essai est destine a determiner si les transistors individuels sont conformes a la duree de vie exigee du porteur chaud dans un processus (C)MOS donne.