Semiconductor devices - Metallization stress void test
STANDARD published on 22.4.2010
Designation standards: IEC 62418-ed.1.0
Publication date standards: 22.4.2010
The number of pages: 34
Approximate weight : 102 g (0.22 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC 62418:2010 describes a method of metallization stress void test and associated criteria. It is applicable to aluminium (Al) or copper (Cu) metallization. La CEI 62418:2010 decrit une methode dessai sur les cavites dues aux contraintes generees par la metallisation et les criteres associes. Elle sapplique a la metallisation a laluminium (Al) ou au cuivre (Cu).