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ISO 14237:2010-ed.2.0

Surface chemical analysis — Secondary-ion mass spectrometry — Determination of boron atomic concentration in silicon using uniformly doped materials

STANDARD published on 9.7.2010

English -
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English -
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French -
electronic design (pdf) (210.90 USD)

French -
Print design (210.90 USD)

The information about the standard:

Designation standards: ISO 14237:2010-ed.2.0
Publication date standards: 9.7.2010
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: International technical standard
Category: Technical standards ISO