ISO 14701:2018-ed.2.0

Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness

STANDARD published on 31.10.2018

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The information about the standard:

Designation standards: ISO 14701:2018-ed.2.0
Publication date standards: 31.10.2018
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: International technical standard
Category: Technical standards ISO