ISO 17297:2025

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

STANDARD published on 26.5.2025

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electronic design (pdf) (143.00 USD)

The information about the standard:

Designation standards: ISO 17297:2025
Publication date standards: 26.5.2025
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: International technical standard
Category: Technical standards ISO

Annotation of standard text ISO 17297:2025 :

Description / Abstract: This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).