ISO 6342:2003-ed.2.0

Micrographics — Aperture cards — Method of measuring thickness of buildup area

STANDARD published on 15.7.2003

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The information about the standard:

Designation standards: ISO 6342:2003-ed.2.0
Publication date standards: 15.7.2003
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: International technical standard
Category: Technical standards ISO

Annotation of standard text ISO 6342:2003-ed.2.0 :

Description / Abstract: ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.