JIS C2162:2010

Test method of long-term reliability of gate insulator for SiC devices at high temperature

STANDARD published on 23.3.2010

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The information about the standard:

Designation standards: JIS C2162:2010
Publication date standards: 23.3.2010
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: Other standards
Category: Technical standards JIS