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JIS C5630-2:2009

Semiconductor devices -- Micro-electromechanical devices-- Part 2: Tensile testing method of thin film materials

STANDARD published on 20.3.2009

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The information about the standard:

Designation standards: JIS C5630-2:2009
Publication date standards: 20.3.2009
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: Other standards
Category: Technical standards JIS