JIS H0604:1995

Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method

STANDARD published on 31.7.1995

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The information about the standard:

Designation standards: JIS H0604:1995
Publication date standards: 31.7.1995
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: Other standards
Category: Technical standards JIS