JIS K0143:2023

Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials

STANDARD published on 20.2.2023

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The information about the standard:

Designation standards: JIS K0143:2023
Publication date standards: 20.2.2023
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Other standards
Category: Technical standards JIS