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JIS K0146:2002

Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials

STANDARD published on 30.4.2002

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The information about the standard:

Designation standards: JIS K0146:2002
Publication date standards: 30.4.2002
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Other standards
Category: Technical standards JIS