JIS K0160:2009

Surface chemical analysis -- Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

STANDARD published on 20.7.2009

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The information about the standard:

Designation standards: JIS K0160:2009
Publication date standards: 20.7.2009
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Other standards
Category: Technical standards JIS