
Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
STANDARD published on 20.4.2010
Designation standards: JIS K0163:2010
Publication date standards: 20.4.2010
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: Other standards
Category: Technical standards JIS