JIS K0169:2012

Surface chemical analysis -- Secondary-ion mass spectrometry (SIMS) -- Method for estimating depth resolution parameters with multiple delta-layer reference materials

STANDARD published on 20.4.2012

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The information about the standard:

Designation standards: JIS K0169:2012
Publication date standards: 20.4.2012
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: Other standards
Category: Technical standards JIS