JIS R1636:1998

Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer

STANDARD published on 31.1.1998

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The information about the standard:

Designation standards: JIS R1636:1998
Publication date standards: 31.1.1998
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: Other standards
Category: Technical standards JIS