JIS R1637:1998

Test method for resistivity of conductive fine ceramic thin films with a four-point probe array

STANDARD published on 31.1.1998

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The information about the standard:

Designation standards: JIS R1637:1998
Publication date standards: 31.1.1998
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: Other standards
Category: Technical standards JIS