SAE J1752/2

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

STANDARD published on 1.1.2003

The information about the standard:

Designation standards: SAE J1752/2
Note: Historical
Publication date standards: 1.1.2003
Country: American technical standard
Category: Technical standards SAE