Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
STANDARD published on 1.1.2003
Designation standards: SAE J1752/3
Note: Historical
Publication date standards: 1.1.2003
Country: American technical standard
Category: Technical standards SAE