SAE J1752/3

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

STANDARD published on 1.1.2003

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The information about the standard:

Designation standards: SAE J1752/3
Note: Historical
Publication date standards: 1.1.2003
Country: American technical standard
Category: Technical standards SAE