STN 358757-1 (358757)

Transistors. Measuring method of collector-base and emitter-base breakdown voltage

STANDARD published on 1.1.1985

The information about the standard:

Designation standards: STN 358757-1
Classification mark: 358757
Catalog number: 59276
Note: WITHDRAWN
Publication date standards: 1.1.1985
Approximate weight : 12 g (0.03 lbs)
Country: Slovak technical standard
Category: Technical standards STN