
Semiconductor devices. Substratums for masks and masks. Measuring methods of characteristic parameters
STANDARD published on 1.12.1984
Designation standards: STN 358971-3
Classification mark: 358971
Catalog number: 59382
Note: WITHDRAWN
Publication date standards: 1.12.1984
Approximate weight : 12 g (0.03 lbs)
Country: Slovak technical standard
Category: Technical standards STN