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STN 356575 (356575)

Standard test procedures for semiconductor X-ray energy spectrometers

STANDARD published on 1.3.1991

Czech -
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The information about the standard:

Designation standards: STN 356575
Classification mark: 356575
Catalog number: 58995
Publication date standards: 1.3.1991
The number of pages: 68
Approximate weight : 204 g (0.45 lbs)
Country: Slovak technical standard
Category: Technical standards STN