Standard test procedures for semiconductor X-ray energy spectrometers
STANDARD published on 1.3.1991
Designation standards: STN 356575
Classification mark: 356575
Catalog number: 58995
Publication date standards: 1.3.1991
The number of pages: 68
Approximate weight : 204 g (0.45 lbs)
Country: Slovak technical standard
Category: Technical standards STN