Semiconductor devices - Mechanical and climatic test methods -- Part 16: Particle impact noise detection (PIND)
STANDARD published on 1.10.2003
Designation standards: STN EN 60749-16
Classification mark: 358799
Catalog number: 91657
Publication date standards: 1.10.2003
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: Slovak technical standard
Category: Technical standards STN