STN EN 60749-29 (358799)

Semiconductor devices – Mechanical and climatic test methods Part 29: Latch-up test

STANDARD published on 1.7.2004

The information about the standard:

Designation standards: STN EN 60749-29
Classification mark: 358799
Catalog number: 95695
Note: WITHDRAWN
Publication date standards: 1.7.2004
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Slovak technical standard
Category: Technical standards STN