STN EN 62374 (358794)

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

STANDARD published on 1.7.2008

The information about the standard:

Designation standards: STN EN 62374
Classification mark: 358794
Catalog number: 106193
Note: WITHDRAWN
Publication date standards: 1.7.2008
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: Slovak technical standard
Category: Technical standards STN