STN EN 60749-17 (358799)

Semiconductor devices - Mechanical and climatic test methods -- Part 17: Neutron irradiation

STANDARD published on 1.11.2003

The information about the standard:

Designation standards: STN EN 60749-17
Classification mark: 358799
Catalog number: 92000
Note: WITHDRAWN
Publication date standards: 1.11.2003
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Slovak technical standard
Category: Technical standards STN