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STN EN 60749-19:2003/A1 (358799)

Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength

STANDARD published on 1.12.2010

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The information about the standard:

Designation standards: STN EN 60749-19:2003/A1
Classification mark: 358799
Catalog number: 112186
Note: Change
Publication date standards: 1.12.2010
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: Slovak technical standard
Category: Technical standards STN