STN EN 60749-3 (358799)

Semiconductor devices - Mechanical and climatic test methods -- Part 3: External visual examination

STANDARD published on 1.2.2003

The information about the standard:

Designation standards: STN EN 60749-3
Classification mark: 358799
Catalog number: 89304
Note: WITHDRAWN
Publication date standards: 1.2.2003
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: Slovak technical standard
Category: Technical standards STN