Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
STANDARD published on 1.11.2008
Designation standards: STN EN 60749-37
Classification mark: 358799
Catalog number: 107047
Publication date standards: 1.11.2008
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: Slovak technical standard
Category: Technical standards STN