STN EN 60749-38 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

STANDARD published on 1.1.2009

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The information about the standard:

Designation standards: STN EN 60749-38
Classification mark: 358799
Catalog number: 107323
Publication date standards: 1.1.2009
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Slovak technical standard
Category: Technical standards STN