STN EN 60749-4 (358799)

Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

STANDARD published on 1.2.2003

Print design (ON REQUEST)

The information about the standard:

Designation standards: STN EN 60749-4
Classification mark: 358799
Catalog number: 89305
Note: WITHDRAWN
Publication date standards: 1.2.2003
The number of pages: 27
Approximate weight : 81 g (0.18 lbs)
Country: Slovak technical standard
Category: Technical standards STN