STN EN 60749-43 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

STANDARD published on 1.1.2018

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The information about the standard:

Designation standards: STN EN 60749-43
Classification mark: 358799
Catalog number: 125810
Publication date standards: 1.1.2018
Approximate weight : 300 g (0.66 lbs)
Country: Slovak technical standard
Category: Technical standards STN