STN EN 60749-44 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

STANDARD published on 1.4.2017

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The information about the standard:

Designation standards: STN EN 60749-44
Classification mark: 358799
Catalog number: 124507
Publication date standards: 1.4.2017
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN