STN EN 60749-5 (358799)

Semiconductor devices - Mechanical and climatic test methods -- Part 5: Steady-state temperature humidity bias life test

STANDARD published on 1.10.2003

Print design (ON REQUEST)

The information about the standard:

Designation standards: STN EN 60749-5
Classification mark: 358799
Catalog number: 91656
Note: WITHDRAWN
Publication date standards: 1.10.2003
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: Slovak technical standard
Category: Technical standards STN