Semiconductor devices - Mechanical and climatic test methods -- Part 6: Storage at high temperature
STANDARD published on 1.2.2003
Designation standards: STN EN 60749-6
Classification mark: 358799
Catalog number: 89306
Note: WITHDRAWN
Publication date standards: 1.2.2003
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: Slovak technical standard
Category: Technical standards STN