Semiconductor devices. Mechanical and climatic test methods
STANDARD published on 1.8.2001
Designation standards: STN EN 60749
Classification mark: 358799
Catalog number: 18009
Note: WITHDRAWN
Publication date standards: 1.8.2001
The number of pages: 52
Approximate weight : 156 g (0.34 lbs)
Country: Slovak technical standard
Category: Technical standards STN