STN EN 62373 (358794)

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

STANDARD published on 1.5.2007

The information about the standard:

Designation standards: STN EN 62373
Classification mark: 358794
Catalog number: 103447
Publication date standards: 1.5.2007
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Slovak technical standard
Category: Technical standards STN