
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
STANDARD published on 1.7.2022
Designation standards: STN EN IEC 60749-28
Classification mark: 358799
Catalog number: 135117
Publication date standards: 1.7.2022
Approximate weight : 51 g (0.11 lbs)
Country: Slovak technical standard
Category: Technical standards STN