STN EN IEC 60749-37 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

STANDARD published on 1.2.2023

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The information about the standard:

Designation standards: STN EN IEC 60749-37
Classification mark: 358799
Catalog number: 136312
Publication date standards: 1.2.2023
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN