STN EN IEC 60749-41 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

STANDARD published on 1.12.2020

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The information about the standard:

Designation standards: STN EN IEC 60749-41
Classification mark: 358799
Catalog number: 132011
Publication date standards: 1.12.2020
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN