Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in March of 2011.)
STANDARD published on 1.1.2016
Designation standards: UNE-EN 15991:2011
Note: WITHDRAWN
Publication date standards: 1.1.2016
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: Spanish technical standard
Category: Technical standards UNE