UNE-EN 60749-16:2003

Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)

STANDARD published on 21.11.2003

English -
electronic design (pdf) (54.60 USD)

English -

Print design (60.10 USD)

Spanish -

electronic design (pdf) (54.60 USD)

Spanish -

Print design (60.10 USD)

The information about the standard:

Designation standards: UNE-EN 60749-16:2003
Publication date standards: 21.11.2003
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Spanish technical standard
Category: Technical standards UNE