UNE-EN 60749-17:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

STANDARD published on 21.11.2003

English -
electronic design (pdf) (47.90 USD)

English -

Print design (52.70 USD)

Spanish -

electronic design (pdf) (39.90 USD)

Spanish -

Print design (43.80 USD)

The information about the standard:

Designation standards: UNE-EN 60749-17:2003
Note: WITHDRAWN
Publication date standards: 21.11.2003
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: Spanish technical standard
Category: Technical standards UNE