UNE-EN 60749-18:2003

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

STANDARD published on 21.11.2003

English -
electronic design (pdf) (82.10 USD)

English -

Print design (90.20 USD)

Spanish -

electronic design (pdf) (68.30 USD)

Spanish -

Print design (75.20 USD)

The information about the standard:

Designation standards: UNE-EN 60749-18:2003
Note: WITHDRAWN
Publication date standards: 21.11.2003
The number of pages: 34
Approximate weight : 102 g (0.22 lbs)
Country: Spanish technical standard
Category: Technical standards UNE