UNE-EN 60749-19:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength

STANDARD published on 21.11.2003

English -
electronic design (pdf) (41.00 USD)

English -

Print design (45.10 USD)

Spanish -

electronic design (pdf) (41.00 USD)

Spanish -

Print design (45.10 USD)

The information about the standard:

Designation standards: UNE-EN 60749-19:2003
Publication date standards: 21.11.2003
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: Spanish technical standard
Category: Technical standards UNE