UNE-EN 60749-19:2003/A1:2011

Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength

STANDARD published on 19.1.2011

English -
electronic design (pdf) (36.50 USD)

English -

Print design (40.10 USD)

Spanish -

electronic design (pdf) (36.50 USD)

Spanish -

Print design (40.10 USD)

The information about the standard:

Designation standards: UNE-EN 60749-19:2003/A1:2011
Note: Change
Publication date standards: 19.1.2011
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: Spanish technical standard
Category: Technical standards UNE