UNE-EN 60749-2:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.

STANDARD published on 30.5.2003

English -
electronic design (pdf) (46.70 USD)

English -

Print design (51.40 USD)

Spanish -

electronic design (pdf) (46.70 USD)

Spanish -

Print design (51.40 USD)

The information about the standard:

Designation standards: UNE-EN 60749-2:2003
Publication date standards: 30.5.2003
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: Spanish technical standard
Category: Technical standards UNE