Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
STANDARD published on 1.1.2013
Designation standards: UNE-EN 60749-27:2006/A1:2012
Note: Change
Publication date standards: 1.1.2013
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: Spanish technical standard
Category: Technical standards UNE