UNE-EN 60749-28:2017

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Espanola de Normalización in August of 2017.)

STANDARD published on 6.4.2025

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The information about the standard:

Designation standards: UNE-EN 60749-28:2017
Note: WITHDRAWN
Publication date standards: 6.4.2025
The number of pages: 52
Approximate weight : 156 g (0.34 lbs)
Country: Spanish technical standard
Category: Technical standards UNE