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UNE-EN 60749-29:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test

STANDARD published on 9.7.2004

Spanish -
electronic design (pdf) (78.80 USD)
Spanish -
Print design (86.70 USD)

The information about the standard:

Designation standards: UNE-EN 60749-29:2004
Note: WITHDRAWN
Publication date standards: 9.7.2004
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Spanish technical standard
Category: Technical standards UNE