UNE-EN 60749-29:2011

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)

STANDARD published on 1.11.2011

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The information about the standard:

Designation standards: UNE-EN 60749-29:2011
Publication date standards: 1.11.2011
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: Spanish technical standard
Category: Technical standards UNE